Digital x-ray firm Kubtec has unveiled new versions of its Xpert 20 and Xpert 40 digital specimen radiography systems.
The new Xpert 20 features faster image acquisition time, a single-wafer detector design, improved image quality, and a 50% increase in field-of-view, according to the vendor. Kubtec believes that the redesigned Xpert 40 is particularly suitable for imaging excised breast tissue. Mobility enhancements and a new height-adjustable monitor aid in intraoperative imaging, the company said. Xpert 40 has detector options up to 8 x 8 inches.
Both systems have also been redesigned with a sleeker, more ergonomic profile, Kubtec said.
