PerkinElmer Optoelectronics of Santa Clara, CA, plans to debut a new line of high-speed high-throughput digital x-ray detectors at the 17th World Conference on Nondestructive Testing (WCNDT) in Shanghai, China.
The launch will mark PerkinElmer's first exhibition in Asia of its digital imaging technologies for a range of industrial and medical applications, including pipeline inspection and diagnostic and therapeutic medical imaging.
The company's new amorphous silicon flat-panel digital x-ray detectors offer increased output speed of up to 30 fps, with a 16-bit resolution and the ability to produce real-time images. The detectors are radiation-hardened and designed to withstand the high-energy test environments found in production lines, according to PerkinElmer.
The new systems are XRD 1621 N ES, 16-inch detectors that are suitable for radiation energies from 20 keV to 15 MeV and feature a pixel size of 200 microns and an image size of 2048 x 2048 pixels, and XRD 0820 N ES, 8-inch detectors that are suitable for radiation energies from 20 keV to 450 keV. They offer a pixel size of 200 microns and an image size of 1024 x 1024 pixels.
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